Invention Grant
- Patent Title: Exposure apparatus and device manufacturing method
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Application No.: US13916219Application Date: 2013-06-12
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Publication No.: US09599907B2Publication Date: 2017-03-21
- Inventor: Hiroyuki Nagasaka , Hirotaka Kohno , Yasufumi Nishii
- Applicant: NIKON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIKON CORPORATION
- Current Assignee: NIKON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2004-123253 20040419
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/42 ; G03B27/54 ; G03B27/58 ; G03F7/20

Abstract:
An exposure apparatus where liquid supply operation and liquid recovery operation for forming a liquid immersion region are excellently performed to form the liquid immersion region in a desired condition, enabling high exposure accuracy and measurement accuracy to be achieved. An exposure apparatus (EX) is an apparatus that exposes a substrate (P) by emitting exposure light (EL) on the substrate (P) through liquid (LQ). The exposure apparatus has a liquid supply mechanism (10) having a supply opening (13) capable of supplying the liquid (LQ) in the direction substantially parallel to the surface of the substrate (P).
Public/Granted literature
- US20130271739A1 EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD Public/Granted day:2013-10-17
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