Invention Grant
- Patent Title: Local error detection and global error correction
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Application No.: US14396327Application Date: 2012-05-31
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Publication No.: US09600359B2Publication Date: 2017-03-21
- Inventor: Aniruddha Nagendran Udipi , Naveen Muralimanohar , Norman Paul Jouppi , Alan Lynn Davis , Rajeev Balasubramonian
- Applicant: Aniruddha Nagendran Udipi , Naveen Muralimanohar , Norman Paul Jouppi , Alan Lynn Davis , Rajeev Balasubramonian
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- Agency: Hewlett Packard Enterprise Patent Department
- International Application: PCT/US2012/040108 WO 20120531
- International Announcement: WO2013/180714 WO 20131205
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F11/10 ; G11C29/04

Abstract:
An example system in accordance with an aspect of the present disclosure is to use local error detection (LED) and global error correction (GEC) information to check data fidelity and correct an error. The LED is to be calculated per cache line segment of data associated with a rank of a memory. Data fidelity may be checked in response to a memory read operation, based on the LED information, to identify a presence of an error and the location of the error among cache line segments of the rank. The cache line segment having the error may be corrected based on the GEC information, in response to identifying the error.
Public/Granted literature
- US20150082122A1 LOCAL ERROR DETECTION AND GLOBAL ERROR CORRECTION Public/Granted day:2015-03-19
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