Invention Grant
- Patent Title: Analyzing behavior of a device under test
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Application No.: US14630919Application Date: 2015-02-25
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Publication No.: US09600385B2Publication Date: 2017-03-21
- Inventor: Aditya Mittal , Shrihari Voniyadka
- Applicant: Arrow Devices Pvt Ltd
- Agency: The Law Office of Austin Bonderer, PC
- Agent Austin Bonderer
- Priority: IN951/CHE/2014 20140225
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/26 ; G06F11/34

Abstract:
A method of analyzing behavior of a device under test includes obtaining event traces that include a current sequence trace and a reference sequence trace. The event traces include one or more transactions that include one or more properties. A list of relevant properties of one or more transactions is obtained. A first set of n-tuples including values of the relevant properties for the current sequence trace is extracted. A second set of n-tuples including values of the relevant properties for the reference sequence trace is extracted. The first set of n-tuples is compared with the second set of n-tuples to indicate one or more transaction indices corresponding to differences in transactions between the current sequence trace and the reference sequence trace. Transactions corresponding to the transaction indices are annotated to obtain annotated transactions. The current sequence trace and/or the reference sequence trace are displayed with the annotated transactions.
Public/Granted literature
- US20150242296A1 ANALYZING BEHAVIOR OF A DEVICE UNDER TEST Public/Granted day:2015-08-27
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