Invention Grant
- Patent Title: Assessment device, assessment system, assessment method, and computer-readable storage medium
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Application No.: US14440791Application Date: 2013-11-06
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Publication No.: US09601010B2Publication Date: 2017-03-21
- Inventor: Satoko Itaya , Peter Davis , Naoki Yoshinaga , Rie Tanaka , Taku Konishi , Shinichi Doi
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2012-244386 20121106
- International Application: PCT/JP2013/080038 WO 20131106
- International Announcement: WO2014/073581 WO 20140515
- Main IPC: G08G1/01
- IPC: G08G1/01 ; G06F17/50

Abstract:
An assessment device (1) includes: a request acquirer (11) that accepts an evaluation target from a user terminal (7); a model acquirer (13) and a data acquirer (14) that select a main model for evaluating the evaluation target accepted by the request acquirer (11) from a plurality of models and select supplemental data to be supplemented for using the main model (data to be input into the main model, a sub-model, or data to be input into the sub-model) when the data to be input into the main model is insufficient; an executor (15) that evaluates the evaluation target based on the main model and supplemental data selected by the model acquirer (13) and the data acquirer (14); and a transmitter (16) that provides a result of the evaluation by the executor (15) to the outside.
Public/Granted literature
- US20150269839A1 ASSESSMENT DEVICE, ASSESSMENT SYSTEM, ASSESSMENT METHOD, AND COMPUTER-READABLE STORAGE MEDIUM Public/Granted day:2015-09-24
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