Invention Grant
- Patent Title: Wafer transport method
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Application No.: US14658867Application Date: 2015-03-16
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Publication No.: US09601360B2Publication Date: 2017-03-21
- Inventor: Jyun-Chao Chen , Ming-Jung Chen , Shao-Yen Ku , Tsai-Pao Su
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsin-Chu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H01L21/67
- IPC: H01L21/67 ; H01L21/677 ; H01L21/673

Abstract:
A wafer transport method is provided. The wafer transport method includes loading an initial carrier containing a first wafer and a second wafer on a first semiconductor apparatus, and processing the first wafer by the first semiconductor apparatus, and loading the first wafer into a first carrier disposed on the first semiconductor apparatus. The wafer transport method also includes processing the second wafer by the first semiconductor apparatus, and loading the second wafer into a second carrier disposed on the first semiconductor apparatus. The wafer transport method further includes processing the first wafer by a second semiconductor apparatus, and loading the first wafer into an integration carrier disposed on the second semiconductor apparatus. The wafer transport method further includes processing the second wafer by the second semiconductor apparatus, and loading the second wafer into the integration carrier disposed on the second semiconductor apparatus.
Public/Granted literature
- US20160276186A1 WAFER TRANSPORT METHOD Public/Granted day:2016-09-22
Information query
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