Invention Grant
- Patent Title: BBUL material integration in-plane with embedded die for warpage control
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Application No.: US13976356Application Date: 2011-12-30
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Publication No.: US09601421B2Publication Date: 2017-03-21
- Inventor: Weng Hong Teh , Deepak V. Kulkarni
- Applicant: Weng Hong Teh , Deepak V. Kulkarni
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- International Application: PCT/US2011/068045 WO 20111230
- International Announcement: WO2013/101161 WO 20130704
- Main IPC: H01L23/498
- IPC: H01L23/498 ; H01L23/00 ; H05K3/46 ; H05K3/00

Abstract:
An apparatus including a die including a first side and an opposite second side including a device side with contact points and lateral sidewalls defining a thickness of the die; a primary core adjacent at least a pair of the lateral sidewalls of the die; and a build-up carrier coupled to the second side of the die, the build-up carrier including a plurality of alternating layers of conductive material and insulating material, wherein at least one of the layers of conductive material is coupled to one of the contact points of the die. A method of forming a package and an apparatus including a computing device including a package are also disclosed.
Public/Granted literature
- US20140217599A1 BBUL MATERIAL INTEGRATION IN-PLANE WITH EMBEDDED DIE FOR WARPAGE CONTROL Public/Granted day:2014-08-07
Information query
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