Invention Grant
- Patent Title: Wafer-level packaging structure for image sensors with packaging cover dike structures corresponding to scribe line regions
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Application No.: US14450153Application Date: 2014-08-01
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Publication No.: US09601531B2Publication Date: 2017-03-21
- Inventor: Zhiqi Wang , Qiong Yu , Wei Wang
- Applicant: China Wafer Level CSP Co., Ltd.
- Applicant Address: CN Suzhou
- Assignee: China Wafer Level CSP Co., Ltd.
- Current Assignee: China Wafer Level CSP Co., Ltd.
- Current Assignee Address: CN Suzhou
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: CN201310373017 20130823
- Main IPC: H01L27/146
- IPC: H01L27/146 ; H01L31/0232

Abstract:
A wafer level packaging structure for image sensors and a wafer level packaging method for image sensors are provided. The wafer level packaging structure includes: a wafer to be packaged including multiple chip regions and scribe line regions between the chip regions; pads and image sensing regions located on a first surface of the wafer and located in the chip regions; first dike structures covering surfaces of the pads and the scribe line regions; a packaging cover arranged facing the first surface of the wafer; and second dike structures located on a surface of the packaging cover. The second dike structures are arranged corresponding to the scribe line regions. The packaging cover and the wafer are jointed fixedly via the second dike structures and the first dike structures.
Public/Granted literature
- US20150054109A1 WAFER LEVEL PACKAGING STRUCTURE FOR IMAGE SENSORS AND WAFER LEVEL PACKAGING METHOD FOR IMAGE SENSORS Public/Granted day:2015-02-26
Information query
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