Invention Grant
- Patent Title: GaN-on-Si switch devices
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Application No.: US13276875Application Date: 2011-10-19
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Publication No.: US09601638B2Publication Date: 2017-03-21
- Inventor: Jenn Hwa Huang , Weixiao Huang
- Applicant: Jenn Hwa Huang , Weixiao Huang
- Applicant Address: US TX Austin
- Assignee: NXP USA, INC.
- Current Assignee: NXP USA, INC.
- Current Assignee Address: US TX Austin
- Main IPC: H01L21/8234
- IPC: H01L21/8234 ; H01L29/812 ; H01L29/66 ; H01L29/20 ; H01L21/265 ; H01L29/51

Abstract:
A low leakage current switch device (110) is provided which includes a GaN-on-Si substrate (11, 13) with one or more device mesas (41) in which isolation regions (92, 93) are formed using an implant mask (81) to implant ions (91) into an upper portion of the mesa sidewalls and the peripheral region around each elevated surface of the mesa structures exposed by the implant mask, thereby preventing the subsequently formed gate electrode (111) from contacting the peripheral edge and sidewalls of the mesa structures.
Public/Granted literature
- US20130099324A1 GAN-ON-SI SWITCH DEVICES Public/Granted day:2013-04-25
Information query
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