- Patent Title: Method and system for adjusting the alignment of a photonic beam
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Application No.: US14346592Application Date: 2012-09-21
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Publication No.: US09601896B2Publication Date: 2017-03-21
- Inventor: Sebastian R. De Echaniz , José M. Ibánez Barón , Ramon Sans Ravellat
- Applicant: Jeanologia, S.L.
- Applicant Address: ES Paterna, Valencia
- Assignee: Jeanologia, S.L.
- Current Assignee: Jeanologia, S.L.
- Current Assignee Address: ES Paterna, Valencia
- Agency: Maier & Maier, PLLC
- Priority: ES201131529 20110922
- International Application: PCT/IB2012/055022 WO 20120921
- International Announcement: WO2013/042074 WO 20130328
- Main IPC: G01B11/00
- IPC: G01B11/00 ; H01S3/101 ; B23K26/04 ; G01B11/27 ; G01B11/14

Abstract:
The method comprises: detecting the positions (uo, vo) and (u1, v1) of said photonic beam (L) according to the coordinate axes X, Y on a first and second plane XY, which cut an optical axis X at a first and second point, respectively; comparing the results of said positional detections (uo, vo) and (u1, v1), and: if there are discrepancies which lie outside the margin of error (p), adjusting the angle of the photonic beam (L) according to the angle α and/or the angle β in order to overcome said discrepancies; or if there are no discrepancies which lie outside said margin of error (p), considering the angle of said photonic beam (L) as being properly adjusted. The system is adapted to implement the method set out by the invention.
Public/Granted literature
- US20140233044A1 Method and System for Adjusting the Alignment of a Photonic Beam Public/Granted day:2014-08-21
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