Invention Grant
- Patent Title: Objective quality metric for ocular wavefront measurements
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Application No.: US14531926Application Date: 2014-11-03
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Publication No.: US09603516B2Publication Date: 2017-03-28
- Inventor: Edwin Jay Sarver , Thomas D. Padrick , Max Hall
- Applicant: WaveTec Vision Systems, Inc.
- Applicant Address: US CA Aliso Viejo
- Assignee: WaveTec Vision Systems, Inc.
- Current Assignee: WaveTec Vision Systems, Inc.
- Current Assignee Address: US CA Aliso Viejo
- Agency: Baker Botts L.L.P.
- Main IPC: A61B3/14
- IPC: A61B3/14 ; A61B3/00 ; A61B3/10
Abstract:
A system and method for determining an objective quality metric for image data collected by a wavefront aberrometer. The method may include quantifying a plurality of characteristics of the image data and calculating the objective quality metric based on the quantified characteristics of the image data. The objective quality metric can be a weighted sum of the quantified characteristics of the image data. The weightings for the weighted sum can be determined based on subjective quality metrics assigned to a set of training image data by a human expert.
Public/Granted literature
- US20150157200A1 OBJECTIVE QUALITY METRIC FOR OCULAR WAVEFRONT MEASUREMENTS Public/Granted day:2015-06-11
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