Invention Grant
- Patent Title: Device for processing material of a workpiece and method for calibrating such a device
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Application No.: US13995771Application Date: 2011-12-22
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Publication No.: US09603743B2Publication Date: 2017-03-28
- Inventor: Christian Rathjen , Holger Lubatschowski , Tammo Ripken
- Applicant: Christian Rathjen , Holger Lubatschowski , Tammo Ripken
- Applicant Address: DE Hannover
- Assignee: ROWIAK GMBH
- Current Assignee: ROWIAK GMBH
- Current Assignee Address: DE Hannover
- Agency: Flynn, Thiel, Boutell & Tanis, P.C.
- Priority: DE102010055966 20101223
- International Application: PCT/EP2011/006529 WO 20111222
- International Announcement: WO2012/084255 WO 20120628
- Main IPC: A61B18/18
- IPC: A61B18/18 ; A61F9/008 ; A61B18/04 ; A61B8/10

Abstract:
A device for processing material of a workpiece, the device including a pulsed processing laser, a focusing lens, a beam-deflection unit, a control unit and a confocal detector unit. The intensity of the laser radiation is variable. An imaging unit is provided to detect structures within the workpiece using electromagnetic radiation, wherein the electromagnetic radiation of the imaging unit is radiated via the beam-deflection unit and the focusing lens into the workpiece, and evaluating device is provided and compares the position of the focus of the laser radiation determined by the detector unit with the expected position of the focus in the image of the workpiece obtained by the imaging unit.
Public/Granted literature
- US20130274725A1 DEVICE FOR PROCESSING MATERIAL OF A WORKPIECE AND METHOD FOR CALIBRATING SUCH A DEVICE Public/Granted day:2013-10-17
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