Invention Grant
- Patent Title: Particle adsorption probe
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Application No.: US14390429Application Date: 2013-04-09
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Publication No.: US09606041B2Publication Date: 2017-03-28
- Inventor: Youhei Maeno , Akiko Toyokawa
- Applicant: Nitto Denko Corporation
- Applicant Address: JP Osaka
- Assignee: NITTO DENKO CORPORATION
- Current Assignee: NITTO DENKO CORPORATION
- Current Assignee Address: JP Osaka
- Agency: Sughrue Mion, PLLC
- Priority: JP2012-095414 20120419
- International Application: PCT/JP2013/060664 WO 20130409
- International Announcement: WO2013/157435 WO 20131024
- Main IPC: G01N1/02
- IPC: G01N1/02 ; B25J7/00 ; G01N15/10 ; B01L3/02 ; G01N1/04 ; G01N1/28 ; B82Y35/00

Abstract:
Provided is a novel particle adsorption probe (1000) for picking up a particle by adsorbing the particle. The particle adsorption probe (1000) can selectively pick up a particle having a specific particle diameter from a group of particles having a wide particle diameter distribution without requiring the application of a physical stress in picking up the particle and without contaminating a foreign matter surface in picking up the particle, and allows the particle to be analytically evaluated in an analysis apparatus directly after picking up the particle. The particle adsorption probe (1000) of the present invention includes a carbon nanotube aggregate (100) including a plurality of carbon nanotubes (10).
Public/Granted literature
- US20150040690A1 PARTICLE ADSORPTION PROBE Public/Granted day:2015-02-12
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