Invention Grant
- Patent Title: Specimen analyzer and specimen analyzing method
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Application No.: US13053921Application Date: 2011-03-22
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Publication No.: US09606133B2Publication Date: 2017-03-28
- Inventor: Yuji Wakamiya , Kazutoshi Tokunaga
- Applicant: Yuji Wakamiya , Kazutoshi Tokunaga
- Applicant Address: JP Kobe-shi, Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi, Hyogo
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-070660 20100325
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N35/00

Abstract:
A specimen analyzer for continuously measuring a plurality of samples, using a reagent container which comprises a wirelessly writable and readable storage medium is disclosed. A specimen analyzing method is also disclosed. The analyzer comprises a reagent dispenser, a measurement unit, a memory which stores information regarding a remaining amount of the reagent in a reagent container, and a wireless communication unit. The analyzer causes the reagent dispenser to continuously carry out aspiration of the reagent from the reagent container, updates the information in the memory in response to an aspiration of the reagent by the reagent dispenser, and causes the wireless communication unit to write the information in the memory to the storage medium when the continuous aspiration is completed.
Public/Granted literature
- US20110236981A1 SPECIMEN ANALYZER AND SPECIMEN ANALYZING METHOD Public/Granted day:2011-09-29
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