A device under test (DUT) has terminals connected to electrically conductive contacts which are in turn connect to a load board and to a test signal source. A second set of kelvin terminals are likewise connected to the DUT, but by pass the load board for connection to a test signal source. The kelvin terminals extend distally away from the DUT and are bonded to a flex circuit at their distal ends so that they make electrical and mechanical contact with the flex circuit. An intermediary terminal block receives the flex circuit and a ribbon cable or other wire connects to a test signal source. The entire circuit then circumvents the use of the load board.