- Patent Title: Insulation inspection method and insulation inspection apparatus
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Application No.: US14399910Application Date: 2013-05-08
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Publication No.: US09606162B2Publication Date: 2017-03-28
- Inventor: Munehiro Yamashita
- Applicant: Munehiro Yamashita
- Applicant Address: JP Kyoto
- Assignee: Nidec-Read Corporation
- Current Assignee: Nidec-Read Corporation
- Current Assignee Address: JP Kyoto
- Agency: Wiggin and Dana LLP
- Agent Abraham Kasdan; Jonathan D. Hall
- Priority: JP2012-106843 20120508
- International Application: PCT/JP2013/062900 WO 20130508
- International Announcement: WO2013/168729 WO 20131114
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/28

Abstract:
An insulation test apparatus and method for a circuit board having a plurality of wiring patterns formed thereon includes: selection means for selecting wiring patterns to be tested, power supply means for sending a predetermined electrical output between a first object to be measured and a target object to be measured; measurement means for measuring an electrical signal between the first object to be measured and the target object to be measured; and calculation means for calculating the resistance of an insulation failure portion between the first object to be measured and the target object to be measured.
Public/Granted literature
- US20150084643A1 INSULATION INSPECTION METHOD AND INSULATION INSPECTION APPARATUS Public/Granted day:2015-03-26
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