Invention Grant
- Patent Title: Method and circuit unit for determining fault states in a half-bridge circuit
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Application No.: US14432613Application Date: 2013-10-15
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Publication No.: US09606184B2Publication Date: 2017-03-28
- Inventor: Christoph Hornstein , Ulrich Bley , Kai Kuehnen
- Applicant: Conti Temic microelectronic GmbH
- Applicant Address: DE Nuremberg
- Assignee: CONTI TEMIC MICROELECTRONIC GMBH
- Current Assignee: CONTI TEMIC MICROELECTRONIC GMBH
- Current Assignee Address: DE Nuremberg
- Agency: Slayden Grubert Beard PLLC
- Priority: DE102012219243 20121022
- International Application: PCT/EP2013/071502 WO 20131015
- International Announcement: WO2014/063955 WO 20140501
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/327 ; H03K17/18 ; H02M1/38 ; G01R31/26 ; G01R31/28

Abstract:
A method is disclosed for determining fault states in a half-bridge circuit having at least a first semiconductor switch and a second semiconductor switch are connected in series with one another and each controllable by a control signal to switch between an open and a closed switching state. For each of the first and second semiconductor switches, an actual switching state and a setpoint switching state are determined. A bridge short circuit in the half-bridge circuit is identified if both (a) the actual switching state of the first semiconductor switch is different than the setpoint switching state of the first semiconductor switch and (b) the actual switching state of the second semiconductor switch is different than the setpoint switching state of the second semiconductor switch.
Public/Granted literature
- US20150276875A1 Method and Circuit Unit for Determining Fault States in a Half-Bridge Circuit Public/Granted day:2015-10-01
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