Invention Grant
- Patent Title: X-ray tomographic inspection system for the identification of specific target items
-
Application No.: US14848176Application Date: 2015-09-08
-
Publication No.: US09606259B2Publication Date: 2017-03-28
- Inventor: Edward James Morton
- Applicant: Rapiscan Systems, Inc.
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Priority: GB0309371.3 20030425; GB0309374.7 20030425; GB0309379.6 20030425; GB0309383.8 20030425; GB0309385.3 20030425; GB0309387.9 20030425; GB0525593.0 20051216; GB0812864.7 20080715; GB0903198.0 20090225
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01V5/00 ; H01J35/04 ; G01N23/203 ; G01N24/08 ; A61B6/02 ; A61B6/03 ; A61B6/00

Abstract:
The present invention provides for an improved scanning process with a stationary X-ray source arranged to generate X-rays from a plurality of X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, and at least one processor arranged to process outputs from the first set of detectors to generate tomographic image data. The X-ray screening system is used in combination with other screening technologies, such as NQR-based screening, X-ray diffraction based screening, X-ray back-scatter based screening, or Trace Detection based screening.
Public/Granted literature
- US20160231454A1 X-ray Tomographic Inspection System for the Identification of Specific Target Items Public/Granted day:2016-08-11
Information query