Invention Grant
- Patent Title: Accurate and fast neural network training for library-based critical dimension (CD) metrology
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Application No.: US14044729Application Date: 2013-10-02
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Publication No.: US09607265B2Publication Date: 2017-03-28
- Inventor: Wen Jin , Vi Vuong , Junwei Bao , Lie-Quan Lee , Leonid Poslavsky
- Applicant: Wen Jin , Vi Vuong , Junwei Bao , Lie-Quan Lee , Leonid Poslavsky
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Blakely Sokoloff Taylor & Zafman, LLP
- Main IPC: G06F15/18
- IPC: G06F15/18 ; G06N3/08 ; G06N3/04

Abstract:
Embodiments are generally directed to neural network training for library-based critical dimension metrology. An embodiment of a method includes optimizing a threshold for a principal component analysis of a spectrum data set to provide a principal component value, estimating a training target for one or more neural networks, training the one or more neural networks based both on the training target and on the principal component value provided from optimizing the threshold for the principal component analysis, and providing a spectral library based on the one or more trained neural networks.
Public/Granted literature
- US20140032463A1 ACCURATE AND FAST NEURAL NETWORK TRAINING FOR LIBRARY-BASED CRITICAL DIMENSION (CD) METROLOGY Public/Granted day:2014-01-30
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