Invention Grant
- Patent Title: Grain appearance measuring apparatus
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Application No.: US14411099Application Date: 2013-05-16
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Publication No.: US09607368B2Publication Date: 2017-03-28
- Inventor: Hideaki Matsushima , Hiroki Ishizuki , Hiroaki Takeuchi
- Applicant: SATAKE CORPORATION
- Applicant Address: JP
- Assignee: Satake Corporation
- Current Assignee: Satake Corporation
- Current Assignee Address: JP
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Priority: JP2012-143709 20120627
- International Application: PCT/JP2013/063700 WO 20130516
- International Announcement: WO2014/002636 WO 20140103
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G01N21/85 ; G06T11/60 ; G03C8/00

Abstract:
A technical object is to enable optical checks to be performed while allowing visual checks using a sample pan to be performed in a pseudo manner using an aggregate image (pseudo image) depicting grains loaded on the sample pan, by optically checking the grains using image information on the grains imaged by an imaging apparatus and creating the aggregate image using the image information. Thus, a grain appearance measuring apparatus includes imaging means for imaging a plurality of grains, analysis means for analyzing image information on the grains imaged by the imaging means in units of grains, processing means for processing the image information to form an aggregate image of the grains, and means for saving and/or displaying the aggregate image processed by the processing means. The processing means extracts grain images from the image information in units of grains and arranges the extracted grain images in units of grains, in a close state where the grain images are close to one another to form an aggregate image of the grain images.
Public/Granted literature
- US20150146938A1 GRAIN APPEARANCE MEASURING APPARATUS Public/Granted day:2015-05-28
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