Invention Grant
- Patent Title: Testing apparatus for electronic device
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Application No.: US14677705Application Date: 2015-04-02
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Publication No.: US09607536B2Publication Date: 2017-03-28
- Inventor: Chun-Sheng Chen , Zhen-Sheng Wang
- Applicant: HONG FU JIN PRECISION INDUSTRY (WuHan) CO., LTD. , HON HAI PRECISION INDUSTRY CO., LTD.
- Applicant Address: CN Wuhan TW New Taipei
- Assignee: HONG FU JIN PRECISION INDUSTRY (WuHan) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: HONG FU JIN PRECISION INDUSTRY (WuHan) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: CN Wuhan TW New Taipei
- Agent Zhigang Ma
- Priority: CN201410565699 20141022
- Main IPC: G01R31/3187
- IPC: G01R31/3187 ; G09G3/00 ; G01R31/317 ; G01R31/30 ; G01R31/28 ; G01R19/257 ; G01R31/319 ; G01R31/3181

Abstract:
A testing apparatus to establish a fault by a process of elimination includes an input unit, a signal converting unit, a switch unit, and a display unit. The input unit receives an input signal and outputs a switch signal. The signal converting unit receives the switch signal and outputs a control signal. The switch unit receives the control signal and outputs a test signal. The display unit receives the test signal and runs a built in self test (BIST) program to test the proper functioning of the display unit. The signal converting unit outputs a data signal and a clock signal to the display unit when the display unit works normally. The signal converting unit not output the data signal and the clock signal to the display unit when the input signal and resulting control signal are repeated.
Public/Granted literature
- US20160117964A1 TESTING APPARATUS FOR ELECTRONIC DEVICE Public/Granted day:2016-04-28
Information query
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