Invention Grant
- Patent Title: Epitaxial wafer manufacturing device and manufacturing method
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Application No.: US14236951Application Date: 2012-08-02
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Publication No.: US09607832B2Publication Date: 2017-03-28
- Inventor: Yoshiaki Kageshima , Tomoyuki Noguchi , Daisuke Muto , Kenji Momose
- Applicant: Yoshiaki Kageshima , Tomoyuki Noguchi , Daisuke Muto , Kenji Momose
- Applicant Address: JP Tokyo
- Assignee: SHOWA DENKO K.K.
- Current Assignee: SHOWA DENKO K.K.
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2011-171635 20110805
- International Application: PCT/JP2012/069695 WO 20120802
- International Announcement: WO2013/021909 WO 20130214
- Main IPC: C30B25/02
- IPC: C30B25/02 ; H01L21/02 ; C30B29/36 ; C30B25/08 ; C23C16/44

Abstract:
Provided is an epitaxial wafer manufacturing device (1) that deposits and grows epitaxial layers on the surfaces of wafers W while supplying a raw material gas to a chamber, wherein a shield (12), arranged in close proximity to the lower surface of a top plate (3) so as to prevent deposits from being deposited on the lower surface of the top plate (3), is removably attached inside the chamber, has an opening (13) in the central portion thereof that forces a gas inlet (9) to face the inside of a reaction space K, and has a structure in which it is concentrically divided into a plurality of ring plates (16), (17) and (18) around the opening (13).
Public/Granted literature
- US20140190400A1 EPITAXIAL WAFER MANUFACTURING DEVICE AND MANUFACTURING METHOD Public/Granted day:2014-07-10
Information query
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