Invention Grant
- Patent Title: Mixed orientation semiconductor device and method
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Application No.: US13962755Application Date: 2013-08-08
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Publication No.: US09607986B2Publication Date: 2017-03-28
- Inventor: Jiang Yan , Danny Pak-Chum Shum , Armin Tilke
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater Matsil, LLP
- Main IPC: H01L31/112
- IPC: H01L31/112 ; H01L27/092 ; H01L21/84 ; H01L27/12

Abstract:
A method of making a semiconductor device begins with a semiconductor wafer that includes a first semiconductor layer overlying a second semiconductor layer. A first trench is etched in the semiconductor wafer. The first trench is filled with insulating material. A second trench is etched within the first trench and through the insulating material, such that insulating material remains along sidewalls of the first trench. The second trench exposes a portion of the second insulating layer. A semiconductor layer can then be grown within the second trench using the second semiconductor layer as a seed layer.
Public/Granted literature
- US20130320401A1 Mixed Orientation Semiconductor Device and Method Public/Granted day:2013-12-05
Information query
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