Invention Grant
- Patent Title: Tunable FIN-SCR for robust ESD protection
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Application No.: US14614622Application Date: 2015-02-05
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Publication No.: US09608098B2Publication Date: 2017-03-28
- Inventor: Mayank Shrivastava , Christian Russ , Harald Gossner
- Applicant: Intel Deutschland GmbH
- Applicant Address: DE Neubiberg
- Assignee: Intel Deutschland GmbH
- Current Assignee: Intel Deutschland GmbH
- Current Assignee Address: DE Neubiberg
- Agency: Eschweiler & Potashnik, LLC
- Main IPC: H01L29/74
- IPC: H01L29/74 ; H01L29/06 ; H01L29/10 ; H01L27/02 ; H01L29/744

Abstract:
One embodiment of the present invention relates to a silicon-controlled-rectifier (SCR). The SCR includes a longitudinal silicon fin extending between an anode and a cathode and including a junction region there between. One or more first transverse fins traverses the longitudinal fin at one or more respective tapping points positioned between the anode and the junction region. Other devices and methods are also disclosed.
Public/Granted literature
- US20150144997A1 Tunable FIN-SCR for Robust ESD Protection Public/Granted day:2015-05-28
Information query
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