Invention Grant
- Patent Title: System and method for determining X-ray exposure parameters
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Application No.: US14552546Application Date: 2014-11-25
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Publication No.: US09610057B2Publication Date: 2017-04-04
- Inventor: Yun Zou , David Allen Langan , Hao Lai , Rowland Frederick Saunders , John Michael Sabol , Guillermo Sander
- Applicant: General Electric Company
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Melissa K. Dobson
- Main IPC: H05G1/64
- IPC: H05G1/64 ; A61B6/00 ; G06T11/00

Abstract:
In accordance with one aspect of the present system, a dual energy X-ray imaging system includes a communication module configured to receive a pre-shot image from a detection circuitry and receive one or more pre-shot parameters from a source controller of the dual energy X-ray imaging system. The dual energy X-ray imaging system further includes an analysis module configured to determine one or more image characteristics of the pre-shot image. The dual energy X-ray imaging system further includes a determination module configured to calculate a first and a second set of main-shot parameters based on the one or more pre-shot parameters and the one or more image characteristics of the pre-shot image. The determination module is further configured to send the one or more main-shot parameters to the source controller of the dual energy X-ray imaging system.
Public/Granted literature
- US20150359502A1 SYSTEM AND METHOD FOR DETERMINING X-RAY EXPOSURE PARAMETERS Public/Granted day:2015-12-17
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