Invention Grant
- Patent Title: Particle monitoring method and particle monitoring system
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Application No.: US14237422Application Date: 2012-08-08
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Publication No.: US09612178B2Publication Date: 2017-04-04
- Inventor: Kunio Miyauchi
- Applicant: Kunio Miyauchi
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2011-173888 20110809
- International Application: PCT/JP2012/070205 WO 20120808
- International Announcement: WO2013/022023 WO 20130214
- Main IPC: G01M15/10
- IPC: G01M15/10 ; H01L21/67 ; C23C16/44 ; C23C16/52 ; G01N15/02

Abstract:
A particle monitoring method of monitoring particles included in an exhaust gas from a depressurized processing vessel 12 includes counting the particles included in the exhaust gas from the depressurized processing vessel 12 while cleaning an inside of the depressurized processing vessel 12 by a particle monitor 18; creating a histogram showing a time and the number of particles from a result of the counting of the particles; extracting, from the histogram, a first feature amount indicating a correlation between a mode of the number of the particles and a particle counting period; and extracting, from the histogram, a second feature amount indicating a correlation between the particle counting period and a distribution tendency of the particles during the particle counting period.
Public/Granted literature
- US20140182357A1 PARTICLE MONITORING METHOD AND PARTICLE MONITORING APPARATUS Public/Granted day:2014-07-03
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