Invention Grant
- Patent Title: Apparatus and method of testing a stick
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Application No.: US14608672Application Date: 2015-01-29
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Publication No.: US09612208B2Publication Date: 2017-04-04
- Inventor: Kiyoung Yeon , Nari Ahn
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Samsung-ro, Giheung-Gu, Yongin-si, Gyeonggi-Do
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Samsung-ro, Giheung-Gu, Yongin-si, Gyeonggi-Do
- Agent Robert E. Bushnell, Esq.
- Priority: KR10-2014-0125298 20140919
- Main IPC: G01B9/04
- IPC: G01B9/04 ; G01B11/06 ; G01N21/94

Abstract:
An apparatus of testing a stick includes a tension unit that applies tension to a stick having openings formed therein and fixes the stick in place, a first testing unit that is spaced apart from the stick and tests a surface of the stick, a light dispersion unit that reflects light emitted from the first testing unit, a distance measurement unit that measures a third distance from a bottom surface of the stick to the light dispersion unit, and a control unit that calculates a second distance from a starting point of a protrusion of the stick tested by the first testing unit to the light dispersion unit, calculates a difference between the second distance and the third distance so as to calculate a height of the protrusion and determines whether the stick is defective or not, based on the height of the protrusion.
Public/Granted literature
- US20160084634A1 APPARATUS AND METHOD OF TESTING A STICK Public/Granted day:2016-03-24
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