Invention Grant
- Patent Title: Method of using dual-port measurement system to measure acoustic impedance
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Application No.: US14521755Application Date: 2014-10-23
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Publication No.: US09612225B2Publication Date: 2017-04-04
- Inventor: Mingsian R. Bai , Yi-Yang Lo
- Applicant: National Tsing Hua University
- Applicant Address: TW Hsinchu
- Assignee: National Tsing Hua University
- Current Assignee: National Tsing Hua University
- Current Assignee Address: TW Hsinchu
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: TW103131298A 20140911
- Main IPC: G01N29/028
- IPC: G01N29/028 ; G01N29/09 ; G01N29/24 ; G01N29/44

Abstract:
A method of using a dual-port measurement system to measure acoustic impedance is used to measure an acoustic impedance Z of a tested object. The tested object includes an input end and an output end opposite to the input end. The dual-port measurement system comprises a first impedance tube and a second impedance tube. The first impedance tube includes a first inlet where a plane wave of a sound source is input, and a first outlet connected with the input end. The second impedance tube includes a second inlet connected with the output end, and a second outlet where the plane wave is output. The method uses the dual-port measurement system and a two-boundary method to obtain the acoustic impedances Z, whereby the dual-port measurement system is conveniently applied to various fields, such as the design of earphones, muffler tubes, sound absorption materials, and artificial ears.
Public/Granted literature
- US20160077056A1 METHOD OF USING DUAL-PORT MEASUREMENT SYSTEM TO MEASURE ACOUSTIC IMPEDANCE Public/Granted day:2016-03-17
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