Invention Grant
- Patent Title: Method and apparatus for inspecting a gas sample
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Application No.: US15005032Application Date: 2016-01-25
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Publication No.: US09612228B2Publication Date: 2017-04-04
- Inventor: Yuval Ovadia , Amos Linenberg
- Applicant: S.T.I. Security Technology Integration Ltd.
- Applicant Address: IL Shefayim
- Assignee: S.T.I. Security Technology Integration Ltd.
- Current Assignee: S.T.I. Security Technology Integration Ltd.
- Current Assignee Address: IL Shefayim
- Main IPC: G01N30/30
- IPC: G01N30/30 ; G01N30/08 ; G01N30/02 ; G01N1/22 ; G01N1/40 ; G01N30/12 ; G01N33/00 ; G01N30/14 ; G01N1/02

Abstract:
An apparatus for detecting a presence of at least one analyte in a gas sample. The apparatus comprises a pump for drawing a gas sample from an ambient air, a passage having first and second ends, a chamber connected to the first end and containing a concentrating element for collecting at least one analyte from the gas sample, a chromatographic separator connected to a second end of the passage, and a gas source for streaming a carrier gas via the chamber to transfer the at least one analyte toward at least one chemical detector, via the chromatographic separator, in a first direction. The pump draws the gas sample via the chamber in a second direction and the first and second directions are substantially opposing to one another.
Public/Granted literature
- US20160139088A1 METHOD AND APPARATUS FOR INSPECTING A GAS SAMPLE Public/Granted day:2016-05-19
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