• Patent Title: Fault analysis apparatus, fault analysis method, and recording medium
  • Application No.: US14889906
    Application Date: 2014-05-15
  • Publication No.: US09612898B2
    Publication Date: 2017-04-04
  • Inventor: Ryosuke Togawa
  • Applicant: NEC Corporation
  • Applicant Address: JP Tokyo
  • Assignee: NEC CORPORATION
  • Current Assignee: NEC CORPORATION
  • Current Assignee Address: JP Tokyo
  • Priority: JP2013-116952 20130603
  • International Application: PCT/JP2014/002569 WO 20140515
  • International Announcement: WO2014/196129 WO 20141211
  • Main IPC: G06F11/00
  • IPC: G06F11/00 G06F11/07
Fault analysis apparatus, fault analysis method, and recording medium
Abstract:
An apparatus includes: a log element extraction unit that extracts a log element from log information a combined unit that attaches, to each of the log elements, related system constituent element information and combine the log elements; a pattern extraction unit that extracts a pattern from the combined log information; a conversion unit, when an analysis target pattern includes system constituent element information of conversion target not included in a comparison target pattern, that performs conversion between the system constituent element information of the conversion target and the system constituent element information similar to the conversion target in the comparison target pattern or the analysis target pattern; a comparison unit that detects a difference the analysis target pattern and the comparison target pattern; and a presenting unit that presents, as a portion of a cause of a fault, the system constituent element information indicated by the difference.
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