Invention Grant
- Patent Title: Examination support apparatus, and examination support method
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Application No.: US14026030Application Date: 2013-09-13
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Publication No.: US09613540B2Publication Date: 2017-04-04
- Inventor: Hidehiko Mayumi , Toshio Tanaka , Takeaki Kobayashi , Masahiro Kawasaki
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Main IPC: G09B3/00
- IPC: G09B3/00 ; G09B7/00 ; G09B7/06 ; G09B7/02 ; G09B7/04 ; G09B7/08 ; G06Q10/10

Abstract:
The examination support apparatus includes a question database, an answer status database, a question output unit, an answer acquisition unit, a correct/incorrect determination unit, a calculation unit, and a determination unit. The question output unit extracts and outputs examination questions from the question database. The answer acquisition unit acquires an answer to each of the above-described examination questions transmitted from an examinee terminal, and the correct/incorrect determination unit determines whether the answer is correct or incorrect. The calculation unit calculates for the examinee a correct-answer percentage to the examination questions in the same administering section based on a result of the correct/incorrect determination. The determination unit calculates a change in a correct-answer percentage for the examinee from the correct-answer percentage of the examination questions in the particular administering section stored in the answer status database and the correct-answer percentage calculated, and determines the change.
Public/Granted literature
- US20140017655A1 EXAMINATION SUPPORT APPARATUS, AND EXAMINATION SUPPORT METHOD Public/Granted day:2014-01-16
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