Invention Grant
- Patent Title: Memory, memory controller, memory system, method of memory, memory controller and memory system
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Application No.: US14147063Application Date: 2014-01-03
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Publication No.: US09613687B2Publication Date: 2017-04-04
- Inventor: Kyungryun Kim , Sangyong Yoon
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce
- Priority: KR10-2013-0013497 20130206
- Main IPC: G11C11/56
- IPC: G11C11/56 ; G11C16/34 ; G11C16/04 ; G11C29/02 ; G06F11/10 ; H01L27/11578 ; H03M13/37

Abstract:
In one embodiment, the method includes performing a read operation on a memory, and determining, by a memory controller, whether to perform a reliability verification read operation based on a count value and a reference value. The count value is based on a number of read commands issued by the memory controller to the memory, and the reliability verification read operation is for reading data from at least one memory cell associated with at least one unselected word line in the memory. An unselected word line is a word line not selected during the read operation. The method further includes performing the reliability verification read operation for the at least one unselected word line based on the determining.
Public/Granted literature
- US20140223246A1 MEMORY, MEMORY CONTROLLER, MEMORY SYSTEM, METHOD OF MEMORY, MEMORY CONTROLLER AND MEMORY SYSTEM Public/Granted day:2014-08-07
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