Invention Grant
- Patent Title: Storage device and method of reading a storage device in which reliability verification operation is selectively omitted
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Application No.: US15193134Application Date: 2016-06-27
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Publication No.: US09613711B2Publication Date: 2017-04-04
- Inventor: Kyungryun Kim , Taehoon Kim , Sangkwon Moon
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0135611 20141008
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/28 ; G11C16/34 ; G11C16/26 ; G11C16/32

Abstract:
A method controlling the execution of a reliability verification operation in a storage device including a nonvolatile memory device includes; determining whether a read count for a designated unit within the nonvolatile memory device exceeds a count value limit, and upon determining that the read count exceeds the count value limit, executing the reliability verification operation directed to the designated unit, wherein the count value limit is based on at least one of read count information, page bitmap information and environment information stored in the storage device.
Public/Granted literature
- US20160307635A1 STORAGE DEVICE AND RELIABILITY VERIFICATION METHOD Public/Granted day:2016-10-20
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