Invention Grant
- Patent Title: Detection system for detecting fail block using logic block address and data buffer address in a storage tester
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Application No.: US14453647Application Date: 2014-08-07
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Publication No.: US09613718B2Publication Date: 2017-04-04
- Inventor: Young Myoun Han
- Applicant: UNITEST INC.
- Applicant Address: KR Yongin-si, Gyeonggi-do
- Assignee: UNITEST INC.
- Current Assignee: UNITEST INC.
- Current Assignee Address: KR Yongin-si, Gyeonggi-do
- Agency: Rabin & Berdo, P.C.
- Priority: KR10-2013-0116138 20130930
- Main IPC: G11C29/56
- IPC: G11C29/56 ; G11C7/10 ; G11C13/00 ; G06F11/10 ; G06F11/273 ; G11C29/12 ; G06F12/06 ; G11C29/04

Abstract:
Disclosed is a detection system for detecting fail block using logic block address and data buffer address in a storage tester, which is capable of comparing data read from SSD test without expected data buffer. The system comprises a device driver for controlling HBA; a request processor for reading the request to Root Complex and transmitting the result to a data engine; and the data engine for generating data to be transmitted to SSD and comparing the read data.
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