Invention Grant
- Patent Title: Wafer processing method to remove crystal strains
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Application No.: US14704474Application Date: 2015-05-05
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Publication No.: US09613795B2Publication Date: 2017-04-04
- Inventor: Hiroshi Morikazu , Kenya Kai
- Applicant: DISCO CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Disco Corporation
- Current Assignee: Disco Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greer Burns & Crain Ltd.
- Priority: JP2014-099447 20140513
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/263 ; H01L21/268

Abstract:
A wafer is formed by slicing a single crystal ingot and removing crystal strains remaining in a peripheral portion of the wafer. In the crystal strain removing step, a laser beam having such a wavelength as to be transmitted through the wafer is applied to the wafer from one side of the wafer in positions located along the margin of the wafer and spaced a predetermined distance inward from the margin, to cause growth of fine holes and amorphous regions shielding the fine holes, over the range from one side to the other side of the wafer, whereby shield tunnels are formed in an annular pattern. Then, an external force is applied to the wafer along the shield tunnels so as to break the wafer in the region of the shield tunnels, thereby removing the peripheral wafer portion where the crystal strains are remaining.
Public/Granted literature
- US20150332910A1 WAFER PROCESSING METHOD Public/Granted day:2015-11-19
Information query
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