Invention Grant
- Patent Title: Semiconductor ESD protection device
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Application No.: US14341295Application Date: 2014-07-25
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Publication No.: US09613952B2Publication Date: 2017-04-04
- Inventor: Hsin-Liang Chen , Wing-Chor Chan , Shyi-Yuan Wu
- Applicant: Macronix International Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Macronix International Co., Ltd.
- Current Assignee: Macronix International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
- Main IPC: H01L27/02
- IPC: H01L27/02 ; H01L27/088 ; H01L29/78 ; H01L21/8234

Abstract:
A semiconductor device includes high-voltage (HV) and low-voltage (LV) MOS's formed in a substrate. The HV MOS includes a first semiconductor region having a first-type conductivity and a first doping level, a second semiconductor region having the first-type conductivity and a second doping level lower than the first doping level, a third semiconductor region having a second-type conductivity, and a fourth semiconductor region having the first-type conductivity. The first, second, third, and fourth semiconductor regions are arranged along a first direction, and are drain, drift, channel, and source regions, respectively, of the HV MOS. The LV MOS includes the fourth semiconductor region, a fifth semiconductor region having the second-type conductivity, and a sixth semiconductor region having the first-type conductivity. The fourth, fifth, and sixth semiconductor regions are arranged along a second direction different from the first direction, and are drain, channel, and source regions, respectively, of the LV MOS.
Public/Granted literature
- US20160027773A1 SEMICONDUCTOR DEVICE Public/Granted day:2016-01-28
Information query
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