Invention Grant
- Patent Title: Field-effect transistor and semiconductor device
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Application No.: US15066880Application Date: 2016-03-10
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Publication No.: US09613961B2Publication Date: 2017-04-04
- Inventor: Yoshiki Kamata
- Applicant: KABUSHIKA KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabrow, Garrett & Dunner LLP
- Priority: JP2013-255383 20131210
- Main IPC: H01L31/0376
- IPC: H01L31/0376 ; H01L29/10 ; H01L29/768 ; H01L29/76 ; H01L27/092 ; H01L29/786 ; H01L21/84 ; H01L27/12 ; H01L29/04 ; H01L29/16 ; H01L29/165 ; H01L29/20 ; H01L29/205 ; H01L29/22 ; H01L29/225 ; H01L29/24

Abstract:
According to one embodiment, a field-effect transistor includes a source region of a first conductivity type, a drain region of the first conductivity type and a channel region of the first conductivity type between the source region and the drain region, the source region, the drain region and the channel region being disposed in a polycrystalline semiconductor layer; a first layer including an amorphous semiconductor layer disposed on the channel region; a gate insulating layer disposed on the first layer; and a gate electrode disposed on the gate insulating layer.
Public/Granted literature
- US20160197076A1 FIELD-EFFECT TRANSISTOR AND SEMICONDUCTOR DEVICE Public/Granted day:2016-07-07
Information query
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