Invention Grant
- Patent Title: Electronic component, process for producing same, sealing material paste, and filler particles
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Application No.: US14435943Application Date: 2013-10-09
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Publication No.: US09614178B2Publication Date: 2017-04-04
- Inventor: Takashi Naito , Shinichi Tachizono , Kei Yoshimura , Yuji Hashiba , Takuya Aoyagi , Masanori Miyagi , Motomune Kodama , Yuichi Sawai , Tadashi Fujieda , Takeshi Tsukamoto , Hajime Murakami
- Applicant: Hitachi Chemical Company, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi Chemical Company, Ltd.
- Current Assignee: Hitachi Chemical Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Volpe and Koenig, P.C.
- Priority: JP2012-230436 20121018
- International Application: PCT/JP2013/077406 WO 20131009
- International Announcement: WO2014/061515 WO 20140424
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L51/52 ; C03C8/24 ; C03C27/06 ; C03C8/14 ; C03C8/20 ; C08K3/22 ; C08K3/32 ; H01L51/56

Abstract:
In an electronic component including two substrates at least one of which is transparent, an organic member arranged between these substrates, and a bonding portion located onto respective outer circumferential portions of the two substrates, this bonding portion includes a low-melting glass and filler particles. The low-melting glass includes vanadium oxide. The filler particles include a low thermally-expandable material, and an oxide containing a bivalent transition metal as a constituent element. The oxide is dispersed in the low thermally-expandable material, and the low thermally-expandable material has a thermal expansion coefficient of 5×10−7/° C. or less in a temperature range from 30 to 250° C. This invention makes it possible to heat the filler particles by irradiation with a laser to give the electronic component which is a component having a highly reliable bonding portion.
Public/Granted literature
- US20150270508A1 ELECTRONIC COMPONENT, PROCESS FOR PRODUCING SAME, SEALING MATERIAL PASTE, AND FILLER PARTICLES Public/Granted day:2015-09-24
Information query
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