• Patent Title: Heterodyne spectrally controlled interferometry
  • Application No.: US14834727
    Application Date: 2015-08-25
  • Publication No.: US09618320B2
    Publication Date: 2017-04-11
  • Inventor: Artur Olszak
  • Applicant: Artur Olszak
  • Agent Antonio R. Durando
  • Main IPC: G01B9/02
  • IPC: G01B9/02
Heterodyne spectrally controlled interferometry
Abstract:
Heterodyne interferometry is combined with spectrally-controlled interferometry (SCI) to achieve the advantages of both. Phase shifts produced by SCI produce phase-shifted correlograms suitable for heterodyne interferometric analysis, thereby enabling interferometric measurements with conventional common-path apparatus free of coherence noise and scanning-related errors, and with the precision of conventional heterodyne interferometry. A spectrum-modulating light source suitable for the invention is obtained by combining a rotating spiral grating with a multi-slit grating placed in the front focal plane of a collimating lens that propagates the light toward a blazed diffraction grating. Another exemplary spectrum-modulating light source is obtained by combining a slit spectrometer with an acousto-optic modulator.
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