Invention Grant
- Patent Title: Sample analyzer
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Application No.: US14226249Application Date: 2014-03-26
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Publication No.: US09618504B2Publication Date: 2017-04-11
- Inventor: Tsukasa Hirata , Shoichiro Asada , Naoya Maeda , Kosuke Yamaguchi
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe-shi
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi
- Agency: Mots Law, PLLC
- Priority: JP2013-071429 20130329
- Main IPC: G01N33/00
- IPC: G01N33/00 ; G01N33/53 ; G01N35/00

Abstract:
To provide a sample analyzer capable of accurately obtaining the number of analyzable samples. When analyzing a sample collected from a subject, a CPU of the sample analyzer calculates the number of analyzable samples based on a remaining number of tests of a reagent set in a reagent holding section and the number of tests of the reagent to be consumed in measurement of a control, and causes a output section to display the number of analyzable samples. When creating a calibration curve, the CPU calculates the number of analyzable samples based on a remaining number of tests of the reagent set in the reagent holding section, the number of tests of the reagent to be consumed in measurement of the control, and the number of tests of the reagent to be consumed in measurement of a calibrator, and causes the output section to display the number of analyzable samples.
Public/Granted literature
- US20140295453A1 SAMPLE ANALYZER, SAMPLE ANALYSIS METHOD, AND NON-TRANSITORY STORAGE MEDIUM Public/Granted day:2014-10-02
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