Invention Grant
- Patent Title: Debugging scan latch circuits using flip devices
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Application No.: US14706354Application Date: 2015-05-07
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Publication No.: US09618580B2Publication Date: 2017-04-11
- Inventor: James D. Warnock
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Margaret A. McNamara, Esq.; Kevin P. Radigan, Esq.
- Main IPC: H03K3/289
- IPC: H03K3/289 ; G01R31/3177

Abstract:
A latch circuit having a master latch and a slave latch includes a device used to short either the master latch or the slave latch. The device includes a transistor and a global control used to assert a signal, and is positioned to short an inverter of the master latch or the slave latch. When the signal is asserted by the global control, the inverter is shorted such that the output value of the inverter is the same as the input value. The assertion of the signal is facilitated by another device connected to the master latch and the slave latch that includes the global control and a transistor.
Public/Granted literature
- US20160327608A1 DEBUGGING SCAN LATCH CIRCUITS USING FLIP DEVICES Public/Granted day:2016-11-10
Information query
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