Invention Grant
- Patent Title: System on chip for debugging a cluster regardless of power state of the cluster, method of operating the same, and system having the same
-
Application No.: US14339786Application Date: 2014-07-24
-
Publication No.: US09619011B2Publication Date: 2017-04-11
- Inventor: Gyoung Hwan Hyun
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2013-0096376 20130814
- Main IPC: G06F1/32
- IPC: G06F1/32 ; G01R31/3185

Abstract:
A system on chip includes a debugging controller, a plurality of clusters, and a power management unit (PMU). The debugging controller is included in a first power domain and a joint test action group (JTAG) interface is included in the first power domain. Each of the clusters is included in at least second power domain different from the first power domain. The PMU is configured to release a powered-off state of the debugging controller in response to a debugging request signal output from the JTAG interface.
Public/Granted literature
Information query