- Patent Title: Performance profiling apparatus and performance profiling method
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Application No.: US14086611Application Date: 2013-11-21
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Publication No.: US09619361B2Publication Date: 2017-04-11
- Inventor: Takatoshi Fukuda , Shuji Takada , Kenjiro Mori
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2013-055338 20130318
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/34

Abstract:
A performance profiling apparatus includes: a plurality of counters provided for a routine included in a program; a storage section configured to store an instruction of the program and an identification information indicating the routine of the program; a processor configured to read the instruction from the storage section and to execute a process according to the instruction; and a counter controller configured to, at the time of reading the instruction of the processor, receive the identification information of the instruction which is output from the storage section with the instruction and to instruct a first counter designated by the identification information to count up.
Public/Granted literature
- US20140282435A1 PERFORMANCE PROFILING APPARATUS AND PERFORMANCE PROFILING METHOD Public/Granted day:2014-09-18
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