Invention Grant
- Patent Title: System for and method of checking joule heating of an integrated circuit design
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Application No.: US14471789Application Date: 2014-08-28
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Publication No.: US09619599B2Publication Date: 2017-04-11
- Inventor: Chi-Yeh Yu , Ming-Hsien Lin , Wen-Hao Chen
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW
- Agency: Hauptman Ham, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A method of checking joule heating of an integrated circuit design, the method includes dividing the integrated circuit design into a plurality of windows, determining a power index of each window, adjusting the specification current value associated with each of the corresponding windows, and generating a current violation report, by a processor, of the integrated circuit. Each window includes one or more circuit elements. Each circuit element is associated with a corresponding current value. Each window is associated with a corresponding specification current value. Each power index is associated with a corresponding window. An amount of adjustment of the specification current value is a function of the power index of each corresponding window. The current violation report includes one or more entries. Each entry is associated with at least a corresponding window and one or more corresponding current values which exceed the corresponding adjusted specification current value.
Public/Granted literature
- US20160063160A1 SYSTEM FOR AND METHOD OF CHECKING JOULE HEATING OF AN INTEGRATED CIRCUIT DESIGN Public/Granted day:2016-03-03
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