Invention Grant
- Patent Title: Image symmetry for dip determination
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Application No.: US14781082Application Date: 2014-03-31
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Publication No.: US09619731B2Publication Date: 2017-04-11
- Inventor: Taketo Akama , Josselin Kherroubi , Arnaud Etchecopar
- Applicant: SCHLUMBERGER TECHNOLOGY CORPORATION
- Applicant Address: US TX Sugar Land
- Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
- Current Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
- Current Assignee Address: US TX Sugar Land
- Priority: EP13305414 20130329
- International Application: PCT/US2014/032301 WO 20140331
- International Announcement: WO2014/160994 WO 20141002
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/52 ; G01V1/30 ; G06T7/60 ; G06T7/00 ; G01V3/00

Abstract:
Methods for dip determination from an image obtained by a down-hole imaging tool. For each pixel forming the image, a probability that a symmetry axis coincides with the pixel is determined. A probability map is then generated, depicting the determined probability of each pixel coinciding with the symmetry axis. The probability map and the image are then superposed to generate a mapped image. The symmetry axis is then estimated based on the mapped image. Image pixels coinciding with a boundary of the geologic feature are then selected in multiple depth zones, and a segment of a sinusoid is fitted to the selected image pixels within each depth zone. Dip within each of the depth zones is then determined based on the fitted sinusoid segments therein.
Public/Granted literature
- US20160307066A1 IMAGE SYMMETRY FOR DIP DETERMINATION Public/Granted day:2016-10-20
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