- Patent Title: Systems and methods for identifying anomalous test item renderings
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Application No.: US14928064Application Date: 2015-10-30
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Publication No.: US09619900B2Publication Date: 2017-04-11
- Inventor: Mankit Lee , Roman Merkushen , Ketan Thakker
- Applicant: Educational Testing Service
- Applicant Address: US NJ Princeton
- Assignee: Educational Testing Service
- Current Assignee: Educational Testing Service
- Current Assignee Address: US NJ Princeton
- Agency: Jones Day
- Main IPC: G06K9/68
- IPC: G06K9/68 ; G06T11/00 ; G06T7/00

Abstract:
Systems and methods are provided for determining a test item rendering anomaly. A test item is provided to a first test item rendering system that is configured to generate a first graphical representation of the test item. The test item is provided to a second test item rendering system that is configured to generate a second graphical representation of the test item. A first digital pixel image of the first graphical representation is captured, and a second digital pixel image of the second graphical representation is captured. Pixels of the digital pixel images are processed, where the processing includes comparing the digital pixel images to determine an extent to which the second digital pixel image differs from the first digital pixel image. An indication for the test item is provided when the second digital pixel image differs from the first digital pixel image by more than a threshold amount.
Public/Granted literature
- US20160125269A1 Systems and Methods for Identifying Anomalous Test Item Renderings Public/Granted day:2016-05-05
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