Invention Grant
- Patent Title: Reactor for plasma-based atomic layer etching of materials
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Application No.: US14563566Application Date: 2014-12-08
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Publication No.: US09620382B2Publication Date: 2017-04-11
- Inventor: Gottlieb S. Oehrlein , Dominik Metzler
- Applicant: University of Maryland, College Park
- Applicant Address: US MD College Park
- Assignee: UNIVERSITY OF MARYLAND, COLLEGE PARK
- Current Assignee: UNIVERSITY OF MARYLAND, COLLEGE PARK
- Current Assignee Address: US MD College Park
- Agency: Squire Patton Boggs (US) LLP
- Main IPC: H01L21/311
- IPC: H01L21/311 ; C23C16/455 ; C23C16/52 ; H01J37/32

Abstract:
Plasma-based atomic layer etching of materials may be of benefit to various semiconductor manufacturing and related technologies. For example, plasma-based atomic layer etching of materials may be beneficial for adding and/or removing angstrom thick layers from a surface in advanced semiconductor manufacturing and related technologies that increasingly demand atomistic surface engineering. A method may include depositing a controlled amount of a chemical precursor on an unmodified surface layer of a substrate to create a chemical precursor layer and a modified surface layer. The method may also include selectively removing a portion of the chemical precursor layer, a portion of the modified surface layer and a controlled portion of the substrate. Further, the controlled portion may be removed to a depth ranging from about 1/10 of an angstrom to about 1 nm. Additionally, the deposition and selective removal may be performed under a plasma environment.
Public/Granted literature
- US20150162168A1 REACTOR FOR PLASMA-BASED ATOMIC LAYER ETCHING OF MATERIALS Public/Granted day:2015-06-11
Information query
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