Invention Grant
- Patent Title: Stacked protection devices with overshoot protection and related fabrication methods
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Application No.: US14644041Application Date: 2015-03-10
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Publication No.: US09620496B2Publication Date: 2017-04-11
- Inventor: Weize Chen , Hubert M. Bode , Andreas Laudenbach , Kurt U. Neugebauer , Patrice M. Parris
- Applicant: Weize Chen , Hubert M. Bode , Andreas Laudenbach , Kurt U. Neugebauer , Patrice M. Parris
- Applicant Address: US TX Austin
- Assignee: NXP USA, INC.
- Current Assignee: NXP USA, INC.
- Current Assignee Address: US TX Austin
- Main IPC: H02H3/00
- IPC: H02H3/00 ; H02H3/02 ; H02H9/04 ; H01L27/02 ; H01L27/06 ; H01L21/8222

Abstract:
Protection circuits, device structures and related fabrication methods are provided. An exemplary protection circuit includes a first protection arrangement and a second protection arrangement. The first protection arrangement includes a first transistor having a first collector, a first emitter, and a first base coupled to the first emitter at a first node, and a second transistor having a second collector, a second emitter, and a second base coupled to the second emitter at a second node, the second collector being coupled to the first collector at a third node. The second protection arrangement is coupled electrically in series between the second node and a fourth node. The protection circuit further includes a first diode coupled between the third node and the fourth node.
Public/Granted literature
- US20160268245A1 STACKED PROTECTION DEVICES WITH OVERSHOOT PROTECTION AND RELATED FABRICATION METHODS Public/Granted day:2016-09-15
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