Invention Grant
- Patent Title: Contact structures and methods of forming the same
-
Application No.: US14321366Application Date: 2014-07-01
-
Publication No.: US09620601B2Publication Date: 2017-04-11
- Inventor: Yu-Hung Lin , Sheng-Hsuan Lin , Chih-Wei Chang , You-Hua Chou , Chia-Lin Hsu
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater Matsil, LLP
- Main IPC: H01L29/417
- IPC: H01L29/417 ; H01L21/3205 ; H01L21/285 ; H01L29/66 ; H01L23/485 ; H01L21/768 ; H01L21/02 ; H01L23/532

Abstract:
Embodiments of the present disclosure include contact structures and methods of forming the same. An embodiment is a method of forming a semiconductor device, the method including forming a contact region over a substrate, forming a dielectric layer over the contact region and the substrate, and forming an opening through the dielectric layer to expose a portion of the contact region. The method further includes forming a metal-silicide layer on the exposed portion of the contact region and along sidewalls of the opening; and filling the opening with a conductive material to form a conductive plug in the dielectric layer, the conductive plug being electrically coupled to the contact region.
Public/Granted literature
- US20160005824A1 CONTACT STRUCTURES AND METHODS OF FORMING THE SAME Public/Granted day:2016-01-07
Information query
IPC分类: