Invention Grant
- Patent Title: Rotation angle measurement apparatus
-
Application No.: US15279898Application Date: 2016-09-29
-
Publication No.: US09625278B2Publication Date: 2017-04-18
- Inventor: Takenobu Nakamura , Shigeki Okatake
- Applicant: ASAHI KASEI MICRODEVICES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Asahi Kasei Microdevices Corporation
- Current Assignee: Asahi Kasei Microdevices Corporation
- Current Assignee Address: JP Tokyo
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2013-024616 20130212; JP2014-011348 20140124; JP2014-011349 20140124
- Main IPC: G01B7/14
- IPC: G01B7/14 ; G01R33/06 ; G01D5/14 ; G01R33/07

Abstract:
A rotation angle measurement apparatus includes: a first Hall element pair for detecting a magnetic component in a first direction; a second Hall element pair for detecting a magnetic component in a second direction different from the first direction; a third Hall element pair for detecting a magnetic component in a third direction different from the first direction and the second direction; and a fourth Hall element pair for detecting a magnetic component in a fourth direction different from the first to third directions. An angle calculation unit calculates a first rotation angle θ of a rotating magnet based upon the strengths of the output signals from the first Hall element pair and the second Hall element pair, and calculates a second rotation angle θc of the rotating magnet based upon the strengths of the output signals from the third Hall element pair and the fourth Hall element pair.
Public/Granted literature
- US20170030738A1 ROTATION ANGLE MEASUREMENT APPARATUS Public/Granted day:2017-02-02
Information query