Invention Grant
- Patent Title: Device for determining a bidirectional reflectance distribution function of a subject
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Application No.: US14559726Application Date: 2014-12-03
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Publication No.: US09625309B2Publication Date: 2017-04-18
- Inventor: Loïc Arnaud Baboulaz , Gaël Georges Soudan , Martin Vetterli
- Applicant: Ecole Polytechnique Fédérale de Lausanne (EPFL)
- Applicant Address: CH Lausanne
- Assignee: Ecole Polytechnique Federale de Lausanne (EPFL)
- Current Assignee: Ecole Polytechnique Federale de Lausanne (EPFL)
- Current Assignee Address: CH Lausanne
- Agency: Taft Stettinius & Hollister LLP
- Main IPC: G03B17/00
- IPC: G03B17/00 ; G01J1/02 ; G01N21/55

Abstract:
A device for determining a bidirectional reflectance distribution function of a subject, including a light source for producing an incident light that is directed onto a subject at a predetermined zenith angle and at a predetermined azimuth angle, an element for displacing the light source at any location on the periphery of a hemispherical area centered on the subject, an element for measuring the bidirectional reflectance distribution function of the subject from one fixed location that is preferably aligned with a normal direction defined by the subject, a control unit adapted to control the element for displacing and/or the element for measuring. The element for displacing includes an arc-shaped arm at one end fixedly connected to the light source and slideably connected to a first support to adjust the zenith angle, and an element for pivoting the first support about the normal direction to permit adjustment of the azimuth angle.
Public/Granted literature
- US20160161330A1 Device for Determining a Bidirectional Reflectance Distribution Function of a Subject Public/Granted day:2016-06-09
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